Penetration Testing
COST vs CTEM: What Continuous Offensive Security Testing Requires
Priyanka Aash Co-Founder, FireCompass | 2025 SC Media Power Player Honoree | Author of The AI Divide | Global CISO Platform Community Builder
AI in Cybersecurity
Before Google Cloud Backed gRPC for MCP, FireCompass Built It for Our AI Agents
Debdipta Halder Lead AI Researcher & Engineer | Specializing in LLMs, Fine-tuning & Agentic AI | 9+ Years Tech Experience| Building Scalable GenAI Solutions | Patent Pending
AI in Cybersecurity
SEBI AI Guidelines: What 10k+ Financial Entities Must Do
Priyanka Aash Co-Founder, FireCompass | 2025 SC Media Power Player Honoree | Author of The AI Divide | Global CISO Platform Community Builder
Penetration Testing
Verizon DBIR 2026: The Year Vulnerability Exploitation Beat Credentials. What It Means for Your Pen Testing Program
Priyanka Aash Co-Founder, FireCompass | 2025 SC Media Power Player Honoree | Author of The AI Divide | Global CISO Platform Community Builder
Penetration Testing
10 Questions to Ask Your AI Pen Testing Vendor Before You Sign
Priyanka Aash Co-Founder, FireCompass | 2025 SC Media Power Player Honoree | Author of The AI Divide | Global CISO Platform Community Builder
Penetration Testing
BAS, CTEM, CART, Pen Test, VA, AEV, COST: What Each Actually Does, and When to Use What
Priyanka Aash Co-Founder, FireCompass | 2025 SC Media Power Player Honoree | Author of The AI Divide | Global CISO Platform Community Builder
AI in Cybersecurity
Combinatorial Belief States Are the Cost of Explicit Uncertainty
Arnab Chattopadhayay Co-Founder & VP of Emerging Research, FireCompass | Cybersecurity Researcher | IEEE Author
Penetration Testing
Demystifying Claude Mythos Preview: The Model That Changed Cybersecurity Forever
Arnab Chattopadhayay Co-Founder & VP of Emerging Research, FireCompass | Cybersecurity Researcher | IEEE Author
Penetration Testing
Belief State: Why AI Planning Fails Without It
Arnab Chattopadhayay Co-Founder & VP of Emerging Research, FireCompass | Cybersecurity Researcher | IEEE Author
